Material Analysis-Rocky Mountain Labs

Posted on Monday, September 6th, 2010 at 6:48 am by Jerry in Rocky Mt. Labs News

We are often asked to measure the thickness of thin-films, bonds, and other material structures.  Rocky Mountain Labs has a variety of methods for accomplishing this, depending on the situation.  Films from 1 Å to 1 mm (107 dynamic range) can be measured by our methods.  Call us today for information about material analysis at 800-776-5227 and visit our website at www.rockymountainlabs.com
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We focus on surface analysis and material characterization analysis by using Auger, ESCA, XPS, SIMS, FTIR, SEM, EDS, and AFM