Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM)

Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measured and many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.

Polymer coating on medical device

Membrane

Polysilicon

Surface roughness on glass substrate

Magnetic Force Microscope (MFM) Image of Hard Disk

AFM Phase Image of Obliquely Deposited SiO2 Published Here

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We focus on surface analysis and material characterization analysis by using Auger, ESCA, XPS, SIMS, FTIR, SEM, EDS, and AFM