Scanning Electron Microscopy (SEM) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.

Stainless steel particle found on MEMS device

Cracked polymer film on medical device

Solder joint

Clay Material
Imaged by FESEM

Ceramic Membrane
Imaged by FESEM

Optical Stack
Imaged by FESEM

Disk Drive Head
Imaged by FESEM