Rocky Mountain Laboratories, Inc. - AES or Auger

<body> <table width="756" border=0 cellpadding=0 cellspacing=0> <tr><td><img src="images/logo.gif">                  <a href="rml-iso.html"><img SRC="images/RML-QMI-v-small.jpg" border=0></a></td> <th align="right"><font face="arial,helvetica" size="+1"><b>Rocky Mountain Laboratories, Inc. <br> Call For Quote or More Information:<br> 800-PRO-LABS   (800-776-5227)    </b></font></th> </tr> <tr bgcolor="#ea6b48"><td colspan="2"> </td></tr> <tr><td colspan="2" height="1"></td></tr> <tr bgcolor="#ea6b48"><td colspan="2" height="2"></td></tr> <tr><td colspan="1" width=116 align="left" valign="top"> <blockquote> <font face="arial,helvetica" size="-1"><b>Techniques</b></font> <ul> <li><font face="arial,helvetica"><a href="tech_aes.html">Auger Electron Spectroscopy (AES)</a></font></li> <li><font face="arial,helvetica"><a href="tech_eds.html">Energy Dispersive X-ray Spectroscopy (EDS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_ftir.html">Fourier Transform Infrared Spectroscopy (FTIR)</a></font></li> <li><font face="arial,helvetica"><a href="tech_opt.html">Optical Microscopy</a></font></li> <li><font face="arial,helvetica"><a href="tech_raman.html">Raman Spectroscopy (Raman)</a></font></li> <li><font face="arial,helvetica"><a href="tech_rga.html">Residual Gas Analysis (RGA)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sem.html">Scanning Electron Microscopy (SEM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sims.html">Secondary Ion Mass Spectrometry (SIMS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_spm.html">Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_xps.html">X-Ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis (XPS/ESCA)</a></font></li> <li><font face="arial,helvetica"><a href="techniques.html">Detailed Descriptions</a></font></li> <li><font face="arial,helvetica"><a href="http://www.rockymountainlabs.com" target="_top">Home</a></font></li> </ul> </blockquote> </td> <td colspan=1 width=640> <center> <font face="arial,helvetica" size="+2"><b>Auger Electron Spectroscopy (AES)</b></font></center><p> <font face="arial,helvetica">Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers. All elements except for H and He can be detected at concentrations above 0.1 to 1.0 atom %, depending on the element. In addition, elemental concentration versus depth (up to 2 µm) information can be obtained by ion sputter etching while monitoring every element of interest. Only conductive samples can be measured with this technique. The sampled area varies from 1 mm down to 2 µm in diameter.</font><p> <img src="images/examples/aes/survey.jpg" align="right">  <p><br> <font face="arial,helvetica" size="+2">Nickel oxide prevents bonding/soldering and good electrical contact.</font> <p> <p> <p> <img src="images/examples/aes/profile.jpg" align="left"> <font face="arial,helvetica" size="+2">Polymer film thickness determined by Auger sputter depth profile. Aluminum Oxide detected at interface.</font> <p><br> <img src="images/examples/aes/profile2.jpg" align="right">  <p> <font face="arial,helvetica" size="+2">Properly passivated stainless steel surface, i.e. Cr-oxide <br>rich surface.</font> <p> <p> <p> <center><font face="arial,helvetica" size="+3"><a href="submit_sample.html">How do I submit a job to RML?</a></font><p></center> </td></tr> </table> </body>