Rocky Mountain Laboratories, Inc. - SEM

<body> <table width="756" border=0 cellpadding=0 cellspacing=0> <tr><td><img src="images/logo.gif">                  <a href="rml-iso.html"><img SRC="images/RML-QMI-v-small.jpg" border=0></a></td> <th align="right"><font face="arial,helvetica" size="+1"><b>Rocky Mountain Laboratories, Inc. <br> Call For Quote or More Information:<br> 800-PRO-LABS   (800-776-5227)    </b></font></th> </tr> <tr bgcolor="#ea6b48"><td colspan="2"> </td></tr> <tr><td colspan="2" height="1"></td></tr> <tr bgcolor="#ea6b48"><td colspan="2" height="2"></td></tr> <tr><td colspan="1" width=116 align="left" valign="top"> <blockquote> <font face="arial,helvetica" size="-1"><b>Techniques</b></font> <ul> <li><font face="arial,helvetica"><a href="tech_aes.html">Auger Electron Spectroscopy (AES)</a></font></li> <li><font face="arial,helvetica"><a href="tech_eds.html">Energy Dispersive X-ray Spectroscopy (EDS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_ftir.html">Fourier Transform Infrared Spectroscopy (FTIR)</a></font></li> <li><font face="arial,helvetica"><a href="tech_opt.html">Optical Microscopy</a></font></li> <li><font face="arial,helvetica"><a href="tech_raman.html">Raman Spectroscopy (Raman)</a></font></li> <li><font face="arial,helvetica"><a href="tech_rga.html">Residual Gas Analysis (RGA)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sem.html">Scanning Electron Microscopy (SEM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sims.html">Secondary Ion Mass Spectrometry (SIMS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_spm.html">Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_xps.html">X-Ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis (XPS/ESCA)</a></font></li> <li><font face="arial,helvetica"><a href="techniques.html">Detailed Descriptions</a></font></li> <li><font face="arial,helvetica"><a href="http://www.rockymountainlabs.com" target="_top">Home</a></font></li> </ul> </blockquote> </td> <td colspan=1 width=640> <center> <font face="arial,helvetica" size="+2"><b>Scanning Electron Microscopy (SEM)</b></font></center><p> <font face="arial,helvetica">Scanning Electron Microscopy (SEM) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated <a href="tech_eds.html">Energy Dispersive Spectroscopy (EDS)</a> detector. Collaboration on-line, in real time is available, See Everything that We See.</font><p><br> <img src="images/examples/sem/ssparticle.jpg" align="left">  <p> <p> <font face="arial,helvetica" size="+2">Stainless steel particle found on MEMS device</font> <p> <p> <p> <p> <img src="images/examples/sem/polymer.jpg" align="right">  <p> <p> <font face="arial,helvetica" size="+2">Cracked polymer film on medical device</font> <p> <p> <p> <p> <img src="images/examples/sem/solder.jpg" align="left">  <p> <p> <p> <font face="arial,helvetica" size="+2">Solder joint</font> <p> <p> <p> <p><br> <center><font face="arial,helvetica" size="+3"><a href="submit_sample.html">How do I submit a job to RML?</a></font><p></center> </td></tr> </table> </body>