Rocky Mountain Laboratories, Inc. - SIMS

<body> <table width="756" border=0 cellpadding=0 cellspacing=0> <tr><td><img src="images/logo.gif">                  <a href="rml-iso.html"><img SRC="images/RML-QMI-v-small.jpg" border=0></a></td> <th align="right"><font face="arial,helvetica" size="+1"><b>Rocky Mountain Laboratories, Inc. <br> Call For Quote or More Information:<br> 800-PRO-LABS   (800-776-5227)    </b></font></th> </tr> <tr bgcolor="#ea6b48"><td colspan="2"> </td></tr> <tr><td colspan="2" height="1"></td></tr> <tr bgcolor="#ea6b48"><td colspan="2" height="2"></td></tr> <tr><td colspan="1" width=116 align="left" valign="top"> <blockquote> <font face="arial,helvetica" size="-1"><b>Techniques</b></font> <ul> <li><font face="arial,helvetica"><a href="tech_aes.html">Auger Electron Spectroscopy (AES)</a></font></li> <li><font face="arial,helvetica"><a href="tech_eds.html">Energy Dispersive X-ray Spectroscopy (EDS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_ftir.html">Fourier Transform Infrared Spectroscopy (FTIR)</a></font></li> <li><font face="arial,helvetica"><a href="tech_opt.html">Optical Microscopy</a></font></li> <li><font face="arial,helvetica"><a href="tech_raman.html">Raman Spectroscopy (Raman)</a></font></li> <li><font face="arial,helvetica"><a href="tech_rga.html">Residual Gas Analysis (RGA)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sem.html">Scanning Electron Microscopy (SEM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sims.html">Secondary Ion Mass Spectrometry (SIMS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_spm.html">Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_xps.html">X-Ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis (XPS/ESCA)</a></font></li> <li><font face="arial,helvetica"><a href="techniques.html">Detailed Descriptions</a></font></li> <li><font face="arial,helvetica"><a href="http://www.rockymountainlabs.com" target="_top">Home</a></font></li> </ul> </blockquote> </td> <td colspan=1 width=640> <center> <font face="arial,helvetica" size="+2"><b>Secondary Ion Mass Spectrometry (SIMS)</b></font></center><p> <font face="arial,helvetica">Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.</font><p> <img src="images/examples/sims/ssims.jpg" align="left">  <p><br> <font face="arial,helvetica" size="+2">Silicone detected at delamination interface between chip and package</font> <p> <p> <p> <img src="images/examples/sims/dsims.jpg" align="right">  <p> <p><br> <font face="arial,helvetica" size="+2">Dopant and impurity profile in photovoltaic film</font> <p> <p> <p><br> <center><font face="arial,helvetica" size="+3"><a href="submit_sample.html">How do I submit a job to RML?</a></font><p></center> </td></tr> </table> </body>