Rocky Mountain Laboratories, Inc. - SPM / AFM

<body> <table width="756" border=0 cellpadding=0 cellspacing=0> <tr><td><img src="images/logo.gif">                  <a href="rml-iso.html"><img SRC="images/RML-QMI-v-small.jpg" border=0></a></td> <th align="right"><font face="arial,helvetica" size="+1"><b>Rocky Mountain Laboratories, Inc. <br> Call For Quote or More Information:<br> 800-PRO-LABS   (800-776-5227)    </b></font></th> </tr> <tr bgcolor="#ea6b48"><td colspan="2"> </td></tr> <tr><td colspan="2" height="1"></td></tr> <tr bgcolor="#ea6b48"><td colspan="2" height="2"></td></tr> <tr><td colspan="1" width=116 align="left" valign="top"> <blockquote> <font face="arial,helvetica" size="-1"><b>Techniques</b></font> <ul> <li><font face="arial,helvetica"><a href="tech_aes.html">Auger Electron Spectroscopy (AES)</a></font></li> <li><font face="arial,helvetica"><a href="tech_eds.html">Energy Dispersive X-ray Spectroscopy (EDS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_ftir.html">Fourier Transform Infrared Spectroscopy (FTIR)</a></font></li> <li><font face="arial,helvetica"><a href="tech_opt.html">Optical Microscopy</a></font></li> <li><font face="arial,helvetica"><a href="tech_raman.html">Raman Spectroscopy (Raman)</a></font></li> <li><font face="arial,helvetica"><a href="tech_rga.html">Residual Gas Analysis (RGA)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sem.html">Scanning Electron Microscopy (SEM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sims.html">Secondary Ion Mass Spectrometry (SIMS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_spm.html">Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_xps.html">X-Ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis (XPS/ESCA)</a></font></li> <li><font face="arial,helvetica"><a href="techniques.html">Detailed Descriptions</a></font></li> <li><font face="arial,helvetica"><a href="http://www.rockymountainlabs.com" target="_top">Home</a></font></li> </ul> </blockquote> </td> <td colspan=1 width=640> <center> <font face="arial,helvetica" size="+2"><b>Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM) </b></font></center><p> <font face="arial,helvetica">Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measured and many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.</font><p> <img src="images/examples/spm/afm3.jpg" align="right">  <p> <p><br> <font face="arial,helvetica" size="+2">Polymer coating <br> on medical device</font> <p> <p> <p><br> <img src="images/examples/spm/afm1.jpg" align="left">  <p> <p><br> <font face="arial,helvetica" size="+2">      Membrane</font> <p> <p> <p> <p> <img src="images/examples/spm/afm2.jpg" align="right">  <p> <p><br> <font face="arial,helvetica" size="+2">          Polysilicon</font> <p> <p> <p> <p> <img src="images/examples/spm/rough_glass.jpg" align="left">  <p> <p> <font face="arial,helvetica" size="+2">Surface roughness <br> on glass substrate</font> <p> <p> <p> <p><br> <img src="images/examples/spm/mfm.jpg" align="right">  <p> <font face="arial,helvetica" size="+2">Magnetic Force Microscope<br> (MFM) Image of Hard Disk</font> <p> <p> <p> <p> <center><font face="arial,helvetica" size="+3"><a href="submit_sample.html">How do I submit a job to RML?</a></font><p></center> </td></tr> </table> </body>