Rocky Mountain Laboratories, Inc. - XPS

<body> <table width="756" border=0 cellpadding=0 cellspacing=0> <tr><td><img src="images/logo.gif">                  <a href="rml-iso.html"><img SRC="images/RML-QMI-v-small.jpg" border=0></a></td> <th align="right"><font face="arial,helvetica" size="+1"><b>Rocky Mountain Laboratories, Inc. <br> Call For Quote or More Information:<br> 800-PRO-LABS   (800-776-5227)    </b></font></th> </tr> <tr bgcolor="#ea6b48"><td colspan="2"> </td></tr> <tr><td colspan="2" height="1"></td></tr> <tr bgcolor="#ea6b48"><td colspan="2" height="2"></td></tr> <tr><td colspan="1" width=116 align="left" valign="top"> <blockquote> <font face="arial,helvetica" size="-1"><b>Techniques</b></font> <ul> <li><font face="arial,helvetica"><a href="tech_aes.html">Auger Electron Spectroscopy (AES)</a></font></li> <li><font face="arial,helvetica"><a href="tech_eds.html">Energy Dispersive X-ray Spectroscopy (EDS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_ftir.html">Fourier Transform Infrared Spectroscopy (FTIR)</a></font></li> <li><font face="arial,helvetica"><a href="tech_opt.html">Optical Microscopy</a></font></li> <li><font face="arial,helvetica"><a href="tech_raman.html">Raman Spectroscopy (Raman)</a></font></li> <li><font face="arial,helvetica"><a href="tech_rga.html">Residual Gas Analysis (RGA)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sem.html">Scanning Electron Microscopy (SEM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_sims.html">Secondary Ion Mass Spectrometry (SIMS)</a></font></li> <li><font face="arial,helvetica"><a href="tech_spm.html">Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM)</a></font></li> <li><font face="arial,helvetica"><a href="tech_xps.html">X-Ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis (XPS/ESCA)</a></font></li> <li><font face="arial,helvetica"><a href="techniques.html">Detailed Descriptions</a></font></li> <li><font face="arial,helvetica"><a href="http://www.rockymountainlabs.com" target="_top">Home</a></font></li> </ul> </blockquote> </td> <td colspan=1 width=640> <center> <font face="arial,helvetica" size="+2"><b>X-ray Photoelectron Spectroscopy (XPS)</b></font></center><p> <font face="arial,helvetica">X-ray photoelectron spectroscopy (XPS) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers. All elements except for H and He can be detected at concentrations above 0.05 to 1.0 atom %, depending on the element. In addition, chemical bonding information can be determined from detailed analysis. Conductive and nonconductive samples can be measured and the technique is well suited for polymeric materials. The sampled area varies from 1 mm down to 30 µm in diameter.</font><p> <img src="images/examples/xps/teflon_tube.jpg" align="right">  <p> <p> <font face="arial,helvetica" size="+2">Selenium oxide deposit identified in process tubing.</font> <p> <p> <p><br> <img src="images/examples/xps/treated_fiber.jpg" align="left">  <p> <p> <font face="arial,helvetica" size="+2">Carbon functionality described for ammonia treated fiber.</font> <p> <p> <p><br> <img src="images/examples/xps/optical_film.jpg" align="right">  <p> <p> <font face="arial,helvetica" size="+2">Competitive product analysis reveals DyF<sub>3</sub> film.</font> <p>  <p> <p> <p> <center><font face="arial,helvetica" size="+3"><a href="submit_sample.html">How do I submit a job to RML?</a></font><p></center> </center> </td></tr> </table> </body>